
STMicroelectronics
A dual op-amp in the same package, but with lower performance and a different supply range.
The TL082CDT is a popular dual JFET op-amp known for its high slew rate and low input bias. Finding a replacement requires careful matching of these key parameters, especially the JFET input characteristic.
Major differences in slew rate, input bias current, and supply voltage across all candidates.
Candidates share the common SO-8 package, but pinout requires verification.
No direct, drop-in replacement for the TL082CDT was found. All candidates present significant parametric differences requiring engineering review.
Consider a functional alternative like TS512AIDT, but verify the impact of its much lower slew rate and higher input bias current.
The primary risk is substituting the JFET input of the TL082CDT with a Bipolar input amplifier, which dramatically increases input bias current.

STMicroelectronics
A dual op-amp in the same package, but with lower performance and a different supply range.
| Feature / factor | TL082CDT | TS512AIDT | TS522IDT | Alt 3 | Compatibility / risk |
|---|---|---|---|---|---|
| Package | SO-8 | SO-8 | SO-8 | SO-8 — Package matches.; TS522IDT: Package matches. | |
| Voltage | 6 V to 36 V | 3 V to 30 V | ±2.5 V to ±15 V | 3 V to 30 V / ±2.5 V to ±15 V — Lower max voltage.; TS522IDT: Lower max voltage (30V vs 36V). | |
| Slew Rate | 16 V/µs | 0.8 V/µs | 7 V/µs | 0.8 V/µs / 7 V/µs — Significantly lower slew rate.; TS522IDT: Significantly lower slew rate. | |
| Gbp | 4 MHz | 3 MHz | 15 MHz | 3 MHz / 15 MHz — Slightly lower gain-bandwidth product.; TS522IDT: Much higher GBP may cause instability. | |
| Input Bias Current | 20 pA | 50 nA | - | 50 nA — Much higher, suggests BJT vs JFET input. | |
| Temperature | 0°C to +70°C | - | -40°C to +125°C | -40°C to +125°C — Wider operating temperature range. |
No direct drop-in replacement is identified. Alternatives like TS512AIDT exist in the same package but have different input types and significantly lower slew rates, requiring circuit validation.