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TPD4S014DSQR AI Analysis:
Datasheet, Specs, Alternatives & ECAD

AI summary

TPD4S014DSQR product

TPD4S014DSQR

Specialized ICs

USB protectionVBUS OVPUSB ESD protection2 A load switchWSON-10

TPD4S014DSQR is a USB charger-port protection IC combining VBUS overvoltage isolation, ESD clamps for USB lines, and a 2 A low-resistance load switch.

Best for

  • USB 2.0 charger-port interfaces requiring ESD protection
  • Portable products requiring VBUS overvoltage isolation
  • USB designs with up to 2 A recommended continuous VBUS current

Avoid if

  • The application requires VBUS operation above the specified OVP threshold
  • A different connector interface or higher-current protection architecture is required

Check before use

  • OVP threshold tolerance: 5.9 V to 6.45 V rising
  • Switch resistance and junction temperature at the intended load
  • ACK open-drain pull-up voltage and processor logic compatibility
  • WSON-10 land pattern and exposed-pad thermal layout

Key specifications

VBUS protection
Up to 28 V DC
Recommended continuous current
2.0 A
VBUS switch resistance
151 mΩ typical
ESD rating
±15 kV IEC 61000-4-2 on D+, D-, ID, and VBUS
Package
10-pin WSON, 2.00 mm × 2.00 mm

Compliance & Environment

RoHS
ROHS3 Compliant
REACH
-
MSL
Level-2-260C-1 YEAR
ECCN
-
HTSUS
-

Application

USB charger portsPortable consumer electronics

Datasheet

Texas-Instruments-company-64.pdf

800 KB

Datasheet AI

CAD Models

Download ECAD models for TPD4S014DSQR: KiCad symbol & footprint, Altium footprint, PCB footprint, and 3D model.

EDA Symbol
Schematic symbol for your EDA tool
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PCB Footprint
Land pattern for PCB layout
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3D Model
STEP file for mechanical design
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Where to Buy

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Alternative components

Alternatives are being enriched. Analyze this part in PartGenie for the latest matches.

Design and risk insights

Questions & answers

TPD4S014DSQR is a Texas Instruments USB charger-port protection device in a 10-pin WSON package. It protects VBUS, D+, D-, and ID lines and disconnects VBUSOUT during undervoltage or overvoltage faults.